Vladimir Mancevski, President and CTO, Xidex Corporation
Philip D. Rack, Professor, The University of Tennessee at Knoxville

Materials Science &Technology 2010 Conference and Exhibition, October17–21, 2010, Houston, TX

View the complete presentation:  Vapor-Phase Cutting of CNTs Using a Nanomanipulator Platform-MST10_18Oct2010.pdf

Victor Vartanian, International SEMATECH Manufacturing Initiative
Paul McClure & Vladimir Mancevski, Xidex Corporation
Joseph J. Kopanski, NIST
Philip D. Rack, The University of Tennessee at Knoxville
Ilona Sitnitsky, Vince LaBella, Matthew D. Bresin, & Kathleen Dunn, SUNY Albany

SPIE Optics and Photonics Conference, August 1-5, 2010, San Diego, CA

View the complete presentation: Conductive Carbon Nanotubes for Semiconductor Metrology-SPIE August_2010.pdf

Joseph J. Kopanski, NIST
Paul McClure & Vladimir Mancevski, Xidex Corporation

Frontiers of Characterization and Metrology for Nanoelectronics: 2009. AIP Conference Proceedings, Volume 1173, pp. 212-216 (2009).

View the complete paper:  Enhanced Spatial Resolution SKFM using Conductive CNTs-SPIE 2009.pdf