nanodevices

Enhanced Spatial Resolution Scanning Kelvin Force Microscopy Using Conductive Carbon Nanotube Tips

Joseph J. Kopanski, NIST
Paul McClure & Vladimir Mancevski, Xidex Corporation

Frontiers of Characterization and Metrology for Nanoelectronics: 2009. AIP Conference Proceedings, Volume 1173, pp. 212-216 (2009).